ISO 15932:2013

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ISO 15932:2013 is an international standard that defines terms used in analytical electron microscopy (AEM). It also applies to some related fields, such as TEM, STEM, SEM, EPMA, and EDX. 

ISO 15932:2013 defines terms used in the practice of AEM. It covers both general and specific concepts classified according to their hierarchy in a systematic order. It is applicable to all standardization documents relevant to the practice of AEM.