OTHER
ISO 15932:2013
ISO 15932:2013 is an international standard that defines terms used in analytical electron microscopy (AEM). It also applies to some related fields, such as TEM, STEM, SEM, EPMA, and EDX.
ISO 15932:2013 defines terms used in the practice of AEM. It covers both general and specific concepts classified according to their hierarchy in a systematic order. It is applicable to all standardization documents relevant to the practice of AEM.
📄 Document
Title: APPLICATION FORM OF ISO 15932:2013
📜 Document Instructions:
Please fill the application form and upload required documents online for ISO Certification.
