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ISO/TS 10867:2019

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ISO/TS 10867:2019 is a technical specification that provides guidelines for characterizing single-wall carbon nanotubes (SWCNTs) using near infrared photoluminescence (NIR PL) spectroscopy. It specifically focuses on determining the chiral indices of semi-conducting SWCNTs in a sample. The standard was published in December 2019 and last reviewed and confirmed in 2023. 

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