OTHER
ISO 17867:2020
ISO 17867:2020This standard outlines the use of small-angle X-ray scattering (SAXS) to estimate the average particle size of materials, particularly in the range of 1 nm to 100 nm. SAXS measures how X-rays are scattered by particles, allowing for the determination of their size and shape.
📄 Document
Title: APPLICATION FORM OF ISO 17867:2020
📜 Document Instructions:
Please fill the application form and upload required documents online for ISO Certification.
